Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8310536 | Shape measurement apparatus and shape measurement method | Masaru Akamatsu, Hidehisa Hashizume | 2012-11-13 |
| 8228509 | Shape measuring device | Masaru Akamatsu, Hidehisa Hashizume | 2012-07-24 |
| 5430386 | Method and apparatus for evaluating semiconductor wafers by irradiation with microwave and excitation light | Michel Morin, Jean-Michel Friedt, Hidehisa Hashizume, Chiyo Fujihira, Masatake Hirose | 1995-07-04 |
| 4874939 | Method and apparatus for detecting position/variance of input light using linear and quadratic outputs | Yoshiro Nishimoto, Yasuji Yoneda, Shinichi Imaoka, Akimitsu Nakaue, Yoshihiko Onishi +7 more | 1989-10-17 |
| 4319270 | Surface inspection system for hot radiant material | Nobuo Kimura, Yoshiro Nishimoto | 1982-03-09 |