Issued Patents All Time
Showing 26–29 of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6130749 | System and method for measuring thin film properties and analyzing two-dimensional histograms using a symmetry operation | Steven W. Meeks, Rusmin Kudinar | 2000-10-10 |
| 6031615 | System and method for simultaneously measuring lubricant thickness and degradation, thin film thickness and wear, and surface roughness | Steven W. Meeks, Rusmin Kudinar | 2000-02-29 |
| 5675499 | Optimal probe point placement | William T. Lee, Christopher G. Talbot | 1997-10-07 |
| 5530372 | Method of probing a net of an IC at an optimal probe-point | William T. Lee, Christopher G. Talbot | 1996-06-25 |