Issued Patents All Time
Showing 26–27 of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7925486 | Computer-implemented methods, carrier media, and systems for creating a metrology target structure design for a reticle layout | Robert Hardister, Mike Pochkowski, Amir Widmann, Elyakim Kassel, Mike Adel | 2011-04-12 |
| 7528953 | Target acquisition and overlay metrology based on two diffracted orders imaging | Aviv Frommer, Vladimir Levinski, Jeffrey Byers, Chris Mack, Michael Adel | 2009-05-05 |