Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8494802 | Computer-implemented methods, computer-readable media, and systems for determining one or more characteristics of a wafer | Haiguang Chen, Daniel Kavaldjiev, George Kren | 2013-07-23 |
| 8269960 | Computer-implemented methods for inspecting and/or classifying a wafer | Juergen Reich, Prasanna Dighe, Andrew J. Steinbach, Daniel Kavaldjiev, Stephen Biellak | 2012-09-18 |