Issued Patents All Time
Showing 26–39 of 39 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7362441 | Modulated reflectance measurement system using UV probe | Jon Opsal, Alex Salnik, Allan Rosencwaig | 2008-04-22 |
| 7330260 | Method for measuring ion-implanted semiconductors with improved repeatability | Mira Bakshi, Alex Salnik, Jon Opsal | 2008-02-12 |
| 7280215 | Photothermal system with spectroscopic pump and probe | Alex Salnik, Jon Opsal | 2007-10-09 |
| 7248367 | Characterization of ultra shallow junctions in semiconductor wafers | Alex Salnik, Jon Opsal | 2007-07-24 |
| 7212288 | Position modulated optical reflectance measurement system for semiconductor metrology | Jon Opsal, Alex Salnik | 2007-05-01 |
| 7126690 | Modulated reflectance measurement system using UV probe | Jon Opsal, Alex Salnik, Allan Rosencwaig | 2006-10-24 |
| 7116424 | Modulated reflectance measurement system with multiple wavelengths | Jeffrey T. Fanton, Alex Salnik, Jon Opsal | 2006-10-03 |
| 7106446 | Modulated reflectance measurement system with multiple wavelengths | Jeffrey T. Fanton, Alex Salnik, Jon Opsal | 2006-09-12 |
| 7079249 | Modulated reflectance measurement system with fiber laser technology | Jeffrey T. Fanton, Alex Salnik | 2006-07-18 |
| 7060980 | Method and system for combined photothermal modulated reflectance and photothermal IR radiometric system | Alex Salnik | 2006-06-13 |
| 7002690 | Ion implant monitoring through measurement of modulated optical response | Alex Salnik, Jon Opsal | 2006-02-21 |
| 6989899 | Ion implant monitoring through measurement of modulated optical response | Alex Salnik, Jon Opsal | 2006-01-24 |
| 6917039 | Method and system for combined photothermal modulated reflectance and photothermal IR radiometric system | Alex Salnik | 2005-07-12 |
| 6584341 | Method and apparatus for detection of defects in teeth | Andreas Mandelis, Stephen Abrams, Jose Agustin Garcia-Hecules | 2003-06-24 |