Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7403022 | Method for measuring peak carrier concentration in ultra-shallow junctions | Alex Salnik, Lena Nicolaides, Jon Opsal | 2008-07-22 |
| 7330260 | Method for measuring ion-implanted semiconductors with improved repeatability | Lena Nicolaides, Alex Salnik, Jon Opsal | 2008-02-12 |