YA

Yumiko Abe

KK Kanto Kagaku: 6 patents #10 of 181Top 6%
KT Kabushiki Kaisha Toshiba: 3 patents #8,011 of 21,451Top 40%
NE Nec Electronics: 2 patents #384 of 1,789Top 25%
HI Hitachi: 1 patents #17,742 of 28,497Top 65%
Sumitomo Electric Industries: 1 patents #13,249 of 21,551Top 65%
TS Toshiba Energy Systems & Solutions: 1 patents #268 of 569Top 50%
PA Panasonic: 1 patents #13,264 of 21,108Top 65%
Overall (All Time): #448,432 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
11732332 Nickel-base alloy welding material, welding material for nuclear reactor, nuclear power apparatus and nuclear power structure, and method of repairing nuclear power apparatus and nuclear power structure Yoshinori Katayama, Wataru Kono, Minoru Obata, Yasuo Morishima, Takahiro Hayashi +1 more 2023-08-22
7896970 Semiconductor substrate cleaning liquid and semiconductor substrate cleaning process Hiroshi Tomita, Yuji Yamada, Hiroaki Yamada, Norio Ishikawa 2011-03-01
7565444 Communication system Hiroaki Sato, Yoshinori Hosoe 2009-07-21
7503982 Method for cleaning semiconductor substrate Norio Ishikawa 2009-03-17
7138362 Washing liquid composition for semiconductor substrate Norio Ishikawa, Hidemitsu Aoki, Hiroaki Tomimori, Yoshiko Kasama 2006-11-21
7087562 Post-CMP washing liquid composition Takuo Oowada, Norio Ishikawa, Hidemitsu Aoki, Hiroaki Tomimori 2006-08-08
7084097 Cleaning solution for substrates of electronic materials Norio Ishikawa, Kiyoto Mori 2006-08-01
6749816 High-pressure treatment apparatus, feeding method thereto and protection method thereof Yutaka Hasegawa, Kazuya Yamada, Yoshie Akai, Norihisa Saito, Yoshikazu Matsubayashi +3 more 2004-06-15
6730644 Cleaning solution for substrates of electronic materials Norio Ishikawa, Kiyoto Mori 2004-05-04
6460764 Card exchanging device, card exchanging method, and recording media Tatsuya Sakanashi, Misora Imai, Yoshinori Hosoe 2002-10-08
4525265 Electrochemical sensor capable of determining hydrogen peroxide concentration and analyzer using the same Kenji Yasuda 1985-06-25