JO

Jiro Ohshima

KT Kabushiki Kaisha Toshiba: 8 patents #3,802 of 21,451Top 20%
TO Toshiba: 7 patents #92 of 2,688Top 4%
KT Kabushiki Kaisha Top: 1 patents #53 of 213Top 25%
Overall (All Time): #280,748 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #TitleCo-InventorsDate
5382549 Method of manufacturing polycrystalline silicon having columnar orientation Toshiyo Motozima 1995-01-17
5102826 Method of manufacturing a semiconductor device having a silicide layer Shin-ichi Taka, Toshiyo Motozima, Hiroshi Naruse 1992-04-07
4975381 Method of manufacturing super self-alignment technology bipolar transistor Shin-ichi Taka 1990-12-04
4871685 Method of manufacturing bipolar transistor with self-aligned external base and emitter regions Shin-ichi Taka 1989-10-03
4853342 Method of manufacturing semiconductor integrated circuit device having transistor Shin-ichi Taka 1989-08-01
4853760 Semiconductor device having insulating layer including polyimide film Masahiro Abe, Masaharu Aoyama, Takashi Ajima 1989-08-01
4780426 Method for manufacturing high-breakdown voltage semiconductor device Yutaka Koshino, Yoshiro Baba 1988-10-25
4766086 Method of gettering a semiconductor device and forming an isolation region therein Shin-ichi Taka, Toshiyo Ito, Masaharu Aoyama 1988-08-23
4717682 Method of manufacturing a semiconductor device with conductive trench sidewalls Shin-ichi Taka, Masahiro Abe, Masaharu Aoyama 1988-01-05
4543707 Method of forming through holes by differential etching of stacked silicon oxynitride layers Toshiyo Ito 1985-10-01
4515642 Method of forming deep aluminum doped silicon by implanting Al and Si ions through alumina layer and device formed thereby Takashi Ajima, Yutaka Koshino 1985-05-07
4502207 Wiring material for semiconductor device and method for forming wiring pattern therewith Masahiro Abe, Yutaka Koshino 1985-03-05
4479830 Method of manufacturing a semiconductor device using epitaxially regrown protrusion as an alignment marker Yutaka Koshino, Takashi Ajima, Toshio Yonezawa 1984-10-30
4426234 Method of forming reproducible impurity zone of gallium or aluminum in a wafer by implanting through composite layers and diffusion annealing Yutaka Koshino, Takashi Ajima, Toshio Yonezawa 1984-01-17
4415372 Method of making transistors by ion implantations, electron beam irradiation and thermal annealing Yutaka Koshino, Toshio Yonezawa, Takashi Ajima 1983-11-15
4404736 Method for manufacturing a semiconductor device of mesa type Yutaka Koshino, Takashi Ajima, Masahiro Abe 1983-09-20
4334349 Method of producing semiconductor device Masaharu Aoyama, Toshio Yonezawa 1982-06-15