Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5890501 | Method and device for dissolving surface layer of semiconductor substrate | Minako Kaneko, Itsuro Ishizaki | 1999-04-06 |
| 5732120 | Fluorescent X-ray analyzing apparatus | Takashi Shoji, Tadashi Utaka, Kunihiro Miyazaki, Tsuyoshi Matsumura | 1998-03-24 |
| 5633172 | Method for analying an impurity on a semiconductor substrate | — | 1997-05-27 |
| 5528648 | Method and apparatus for analyzing contaminative element concentrations | Fumio Komatsu, Kunihiro Miyazaki | 1996-06-18 |
| 5497407 | Contaminating-element analyzing method | Fumio Komatsu, Kunihiro Miyazaki | 1996-03-05 |
| 5490194 | Method and apparatus for analyzing contaminative element concentrations | Fumio Komatsu, Kunihiro Miyazaki | 1996-02-06 |
| 5430786 | Element analyzing method | Fumio Komatsu, Kunihiro Miyazaki | 1995-07-04 |
| 5422925 | Contaminating-element analyzing method and apparatus of the same | Fumio Komatsu, Kunihiro Miyazaki | 1995-06-06 |
| 5395446 | Semiconductor treatment apparatus | Mokuji Kageyama, Kiyoshi Yoshikawa | 1995-03-07 |
| 5290733 | Method of manufacturing semiconductor devices including depositing aluminum on aluminum leads | Nobuo Hayasaka, Haruo Okano | 1994-03-01 |
| 4634497 | Method and apparatus for decomposing semiconductor thin film | — | 1987-01-06 |