Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11348222 | Methods and systems for inspection of wafers and reticles using designer intent data | Paul Frank Marella, Sharon McCauley, Ellis Chang, James Wiley, Sterling Watson +2 more | 2022-05-31 |
| 10713771 | Methods and systems for inspection of wafers and reticles using designer intent data | Paul Frank Marella, Sharon McCauley, Ellis Chang, James Wiley, Sterling Watson +2 more | 2020-07-14 |
| 9951585 | Method of inducing micro-seismic fractures and dislocations of fractures | — | 2018-04-24 |
| 9002497 | Methods and systems for inspection of wafers and reticles using designer intent data | James Wiley, Sterling Watson, Sagar A. Kekare, Carl Hess, Paul Frank Marella +2 more | 2015-04-07 |
| 8498468 | Mask inspection | — | 2013-07-30 |
| 8102408 | Computer-implemented methods and systems for determining different process windows for a wafer printing process for different reticle designs | Gaurav Verma, Bo SU, Harold Lehon, Carl Hess | 2012-01-24 |
| 7604906 | Films for prevention of crystal growth on fused silica substrates for semiconductor lithography | Ben Eynon, Brian J. Grenon | 2009-10-20 |
| 7541115 | Use of calcium fluoride substrate for lithography masks | Laurence Wagner | 2009-06-02 |