Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7760347 | Design-based method for grouping systematic defects in lithography pattern writing system | Youval Nehmadi, Ofer Bokobza, Ariel Ben-Porath, Erez Ravid, Vicky Svidenko +2 more | 2010-07-20 |