Issued Patents All Time
Showing 1–25 of 28 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8110881 | MRAM cell structure with a blocking layer for avoiding short circuits | Ya-Chen Kao, Chun-Jung Lin, Yu-Jen Wang, Hsu-Chen Cheng, Feng-Jia Shiu | 2012-02-07 |
| 7514740 | Logic compatible storage device | Te-Hsun Hsu, Derek Lin, Jack Y. Yeh | 2009-04-07 |
| 6828194 | Low voltage programmable and erasable flash EEPROM | Tze Ho Simon Chan | 2004-12-07 |
| 6822268 | Two layer mirror for LCD-on-silicon products and method of fabrication thereof | Sik On Kong | 2004-11-23 |
| 6760258 | Means to erase a low voltage programmable and erasable flash EEPROM | Tze Ho Simon Chan | 2004-07-06 |
| 6703659 | Low voltage programmable and erasable flash EEPROM | Tze Ho Simon Chan | 2004-03-09 |
| 6649461 | Method of angle implant to improve transistor reverse narrow width effect | Tommy Lai, Weining Li | 2003-11-18 |
| 6573143 | Trench transistor structure and formation method | Wei Li | 2003-06-03 |
| 6569699 | Two layer mirror for LCD-on-silicon products and method of fabrication thereof | Sik On Kong | 2003-05-27 |
| 6518122 | Low voltage programmable and erasable flash EEPROM | Tze Ho Simon Chan | 2003-02-11 |
| 6509264 | Method to form self-aligned silicide with reduced sheet resistance | Weining Li | 2003-01-21 |
| 6399443 | Method for manufacturing dual voltage flash integrated circuit | Siow Lee Chwa | 2002-06-04 |
| 6376298 | Layout method for scalable design of the aggressive RAM cells using a poly-cap mask | Weining Li | 2002-04-23 |
| 6362045 | Method to form non-volatile memory cells | Chwa Siow Lee, Chiew Sin Ping | 2002-03-26 |
| 6284603 | Flash memory cell structure with improved channel punch-through characteristics | Chan Tze Ho Simon, Tyrone Philip Stodart, Sung-Rae Kim | 2001-09-04 |
| 6180430 | Methods to reduce light leakage in LCD-on-silicon devices | Sik On Kong, Dai Feng, Robert Tsai | 2001-01-30 |
| 6177304 | Self-aligned contact process using a poly-cap mask | Weining Li, Mau Lam Lai, Tin Tin Wee | 2001-01-23 |
| 6147008 | Creation of multiple gate oxide with high thickness ratio in flash memory process | Siow Lee Chwa, Ying Jin | 2000-11-14 |
| 6001663 | Apparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the same | Zhi-Min Ling, Ying Shiau | 1999-12-14 |
| 5963780 | Method for detecting defect sizes in polysilicon and source-drain semiconductor devices | Zhi-Min Ling, Ying Shiau | 1999-10-05 |
| 5930138 | Arrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runs | Zhi-Min Ling, James M. Pak, Ying Shiau | 1999-07-27 |
| 5917332 | Arrangement for improving defect scanner sensitivity and scanning defects on die of a semiconductor wafer | Ming Chen | 1999-06-29 |
| 5896294 | Method and apparatus for inspecting manufactured products for defects in response to in-situ monitoring | Wanyee A. Chow, Ming Chen, Ying Shiau | 1999-04-20 |
| 5821765 | Apparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the same | Zhi-Min Ling, Ying Shiau | 1998-10-13 |
| 5761065 | Arrangement and method for detecting sequential processing effects in manufacturing | Richard Kittler, Zhi-Min Ling, James M. Pak, Ying Shiau | 1998-06-02 |