Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11928942 | Systems and methods for theft prevention and detection | — | 2024-03-12 |
| 10605294 | Threaded-connection anti-loosening locking device | — | 2020-03-31 |
| 10074036 | Critical dimension uniformity enhancement techniques and apparatus | Hawren Fang | 2018-09-11 |
| 9875534 | Techniques and systems for model-based critical dimension measurements | Abdurrahman Sezginer, Eric Vella, Balaji Ganapathy | 2018-01-23 |
| 9778205 | Delta die and delta database inspection | Carl Hess, Yalin Xiong | 2017-10-03 |
| 9453801 | Photoemission monitoring of EUV mirror and mask surface contamination in actinic EUV systems | Li-Ping Wang, Daimian Wang, Alan Aindow | 2016-09-27 |
| 9335206 | Wave front aberration metrology of optics of EUV mask inspection system | Qiang Zhang, Abdurrahman Sezginer | 2016-05-10 |
| 9151881 | Phase grating for mask inspection system | Daimian Wang, Oleg Khodykin, Daniel Wack, Li-Ping Wang | 2015-10-06 |
| 8941336 | Optical characterization systems employing compact synchrotron radiation sources | Daniel Wack | 2015-01-27 |
| 8749179 | Optical characterization systems employing compact synchrotron radiation sources | Daniel Wack | 2014-06-10 |