Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10141159 | Sample observation device having a selectable acceleration voltage | Ayumi DOI, Tomohiro Funakoshi, Takuma Yamamoto, Tomohiro Tamori | 2018-11-27 |
| 8995748 | Defect image processing apparatus, defect image processing method, semiconductor defect classifying apparatus, and semiconductor defect classifying method | Shigeki Kurihara, Yutaka Tandai, Tamao Ishikawa, Yuichi Hamamura, Tomohiro Funakoshi +2 more | 2015-03-31 |
| 8625906 | Image classification standard update method, program, and image classification device | Yuya Isomae, Fumiaki Endo, Tomohiro Funakoshi, Junko Konishi | 2014-01-07 |
| 8595666 | Semiconductor defect classifying method, semiconductor defect classifying apparatus, and semiconductor defect classifying program | Koichi Hayakawa, Takehiro Hirai, Yutaka Tandai, Tamao Ishikawa, Kazuhisa Hasumi +3 more | 2013-11-26 |
| 8472696 | Observation condition determination support device and observation condition determination support method | Junko Konishi, Tomohiro Funakoshi | 2013-06-25 |