Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11428652 | Pattern evaluation system and pattern evaluation method | Koichiro Irie, Tianming Li | 2022-08-30 |
| 10854420 | Pattern evaluation device | Miki Isawa, Kazuhisa Hasumi | 2020-12-01 |
| 10141159 | Sample observation device having a selectable acceleration voltage | Tomohiro Funakoshi, Takuma Yamamoto, Tomohiro Tamori, Tsunehiro Sakai | 2018-11-27 |
| 9451215 | Control circuit apparatus and endoscope apparatus | — | 2016-09-20 |