Issued Patents All Time
Showing 1–25 of 25 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12374520 | Tweezers, conveyance device, and method for conveying sample piece | Naoki SAMURA, Shinsuke Kawanishi, Yaku Maeda | 2025-07-29 |
| 12347707 | Semiconductor analysis system | Yudai KUBO, Hiroyuki Chiba | 2025-07-01 |
| 12176180 | Method for producing lamella, analysis system and method for analyzing sample | Atsushi Sawada | 2024-12-24 |
| 12119202 | Mechanism for adjusting angle of incidence on charged particle beam aperture, and charged particle beam device | Shunichi Motomura | 2024-10-15 |
| 11817289 | Charged particle beam device | Shunichi Motomura, Tadahiro Kawasaki, Takeharu Kato, Ryuji Yoshida | 2023-11-14 |
| 11798776 | Charged particle beam apparatus | Shunichi Motomura | 2023-10-24 |
| 11784022 | Electron beam apparatus | Takashi Ohshima, Tatsuro Ide, Hideo Morishita, Yoichi Ose, Toshihide Agemura | 2023-10-10 |
| 11640897 | Charged particle beam device | Ryo HIRANO, Chisato Kamiya, Junichi Katane | 2023-05-02 |
| 11430630 | Charged particle beam apparatus | Ryo HIRANO, Chisato Kamiya, Junichi Katane | 2022-08-30 |
| 11335532 | Charged particle beam device | Shunichi Motomura, Tadahiro Kawasaki, Takeharu Kato, Ryuji Yoshida | 2022-05-17 |
| 11268915 | Charged particle beam device, method for processing sample, and observation method | Hiromi Mise | 2022-03-08 |
| 11264201 | Charged particle beam device | Kazuo Ootsuga, Yuta Imai | 2022-03-01 |
| 11183359 | Charged particle beam apparatus | Kenichi Nishinaka | 2021-11-23 |
| 11164716 | Charged particle beam device | Shunichi Motomura, Tadahiro Kawasaki, Takeharu Kato, Ryuji Yoshida | 2021-11-02 |
| 11143606 | Particle measuring device and particle measuring method | Tomihiro Hashizume, Masatoshi Yasutake, Takafumi Miwa | 2021-10-12 |
| 11107656 | Charged particle beam device | Shunichi Motomura, Kenichi Nishinaka, Toshihide Agemura | 2021-08-31 |
| 11067391 | Charged particle beam device and sample thickness measurement method | Takahiro Sato | 2021-07-20 |
| 10886101 | Charged particle beam device | Ryo HIRANO, Hideo Morishita, Toshihide Agemura, Junichi Katane | 2021-01-05 |
| 10128081 | Composite charged particle beam detector, charged particle beam device, and charged particle beam detector | Toshihide Agemura | 2018-11-13 |
| 9966218 | Electron beam device | Toshihide Agemura | 2018-05-08 |
| 9761409 | Composite charged particle detector, charged particle beam device, and charged particle detector | Toshihide Agemura | 2017-09-12 |
| 9478389 | Scanning electron microscope | Toshihide Agemura | 2016-10-25 |
| 9355814 | Charged particle beam apparatus | Toshihide Agemura | 2016-05-31 |
| 8581219 | Composite charged-particle-beam apparatus | Toshihide Agemura | 2013-11-12 |
| 8455820 | Composite charged particle beams apparatus | Toshihide Agemura | 2013-06-04 |