Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9091727 | Configuration and testing of multiple-die integrated circuits | Julian Lupu, Shivani C. Desai, Lee N. Chung | 2015-07-28 |
| 8082535 | Method and apparatus for testing programmable integrated circuits | Ian L. McEwen, Andrew G. Anderson, Reto Stamm | 2011-12-20 |
| 7558995 | Method and apparatus for eliminating noise induced errors during test of a programmable logic device | Randy J. Simmons | 2009-07-07 |
| 6944809 | Methods of resource optimization in programmable logic devices to reduce test time | Andrew W. Lai, Randy J. Simmons, Vincent L. Tong, Jeffrey V. Lindholm, Jay T. Young +2 more | 2005-09-13 |