TS

Tae-Wook Seo

Samsung: 8 patents #15,984 of 75,807Top 25%
IG Ips Group: 3 patents #23 of 66Top 35%
Overall (All Time): #386,619 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8029859 Method of depositing Ge-Sb-Te thin film Jung Wook Lee, Byung Chul Cho, Ki Hoon Lee 2011-10-04
7842606 Method of depositing thin film and method of manufacturing semiconductor using the same Ki Hoon Lee, Young-Hoon Park, Sahng Kyoo Lee, Ho Chang 2010-11-30
7785664 Method of depositing thin film Young-Hoon Park, Ki Hoon Lee, Sahng Kyoo Lee 2010-08-31
7638437 In-situ thin-film deposition method Young-Hoon Park 2009-12-29
7253101 Deposition method of TiN thin film having a multi-layer structure Young-Hoon Park, Sahng Kyoo Lee 2007-08-07
6569782 Insulating layer, semiconductor device and methods for fabricating the same Jin-Ho Jeon, Byoung-Deog Choi, Jong-Seung Yi 2003-05-27
6387776 Method for forming trench isolation regions Jong-Seung Yi, Jin-Ho Jeon 2002-05-14
6376303 Method of manufacturing a capacitor having oxide layers with different impurities and method of fabricating a semiconductor device comprising the same Jeon-Sig Lim 2002-04-23
6372555 Semiconductor integrated circuit device and method of manufacturing the same Seung Jae Lee, Sun-Hoo Park 2002-04-16
6329276 Method of forming self-aligned silicide in semiconductor device Ja-Hum Ku, Soo-geun Lee, Chul-Sung Kim, Eung-Joon Lee, Joo-Hyuk Chung 2001-12-11
6291342 Methods of forming titanium nitride composite layers using composite gases having increasing TiCl4 to NH3 ratios Jang-Eun Lee, Ju-hyuck Chung 2001-09-18
6207557 Method of forming multilayer titanium nitride film by multiple step chemical vapor deposition process and method of manufacturing semiconductor device using the same Jang-Eun Lee, Ju-hyuck Chung 2001-03-27
5326709 Wafer testing process of a semiconductor device comprising a redundancy circuit Hong-bae Moon, Bon-youl Ku, Gi-seung Song 1994-07-05