Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5326709 | Wafer testing process of a semiconductor device comprising a redundancy circuit | Hong-bae Moon, Bon-youl Ku, Tae-Wook Seo | 1994-07-05 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5326709 | Wafer testing process of a semiconductor device comprising a redundancy circuit | Hong-bae Moon, Bon-youl Ku, Tae-Wook Seo | 1994-07-05 |