| 11248937 |
Holder for a sensor unit |
Ronald Steinbrink, Anwar Hegazi |
2022-02-15 |
| 10841586 |
Processing partially masked video content |
— |
2020-11-17 |
| 10805615 |
Synchronizing video signals using cached key frames |
Eugen Wige |
2020-10-13 |
| 10326815 |
Techniques for scalably sharing video through a streaming server |
Robert Chalmers, Sascha Kuemmel, Eugen Wige, Paul Elsner |
2019-06-18 |
| 10237559 |
Layer-based video decoding |
— |
2019-03-19 |
| 10178350 |
Providing shortened recordings of online conferences |
Alexander Mueller, Martin Unzner, Mathias Buhr, Paul Elsner |
2019-01-08 |
| 10091511 |
Efficient video block matching |
Eugen Wige, Sascha Kuemmel |
2018-10-02 |
| 9816368 |
Active control of drill bit walking |
Donald Keith Trichel, Andreas Peter, Oliver Hoehn |
2017-11-14 |
| 9813721 |
Layer-based video encoding |
— |
2017-11-07 |
| 9448481 |
Generalization of shot definitions for mask and wafer writing tools |
Emile Y. Sahouria |
2016-09-20 |
| 9266554 |
Steering column for a motor vehicle |
Detlef Hansen, Torsten Harms, Axel Hebenstreit, Holger Kittler, Jan Maak +2 more |
2016-02-23 |
| 9134616 |
Generalization of shot definitions for mask and wafer writing tools |
Emile Y. Sahouria |
2015-09-15 |
| 9029702 |
Connection assembly for a sensor assembly and sensor assembly |
Ronald Steinbrink, Sven Kluge, Stefan Ortmann, Daniel Matthie, Jens Liebetrau +2 more |
2015-05-12 |
| 8623254 |
Method and device for producing a magnetic field sensor |
Rolf Goetz, Daniel Matthie, Markus Kny, Frank Weishaeutel |
2014-01-07 |
| 7221788 |
Method of inspecting a mask or reticle for detecting a defect, and mask or reticle inspection system |
Henning Haffner |
2007-05-22 |
| 7150946 |
Method for the repair of defects in photolithographic masks for patterning semiconductor wafers |
Enio Carpi |
2006-12-19 |
| 6396160 |
Fill strategies in the optical kerf |
Kathryn H. Varian, Timothy J. Wiltshire |
2002-05-28 |
| 6368516 |
Semiconductor manufacturing methods |
Enio Carpi |
2002-04-09 |
| 6363296 |
System and method for automated defect inspection of photomasks |
— |
2002-03-26 |
| 6270947 |
Method and apparatus for reducing non-uniformity area effects in the manufacture of semiconductor devices |
Franz Zach |
2001-08-07 |
| 6042972 |
Phase shift mask having multiple alignment indications and method of manufacture |
— |
2000-03-28 |
| 5821419 |
Micromechanical sensor unit for detecting acceleration |
Gerhard Mader, Jens Noetzel |
1998-10-13 |
