ES

Emile Y. Sahouria

MG Mentor Graphics: 16 patents #15 of 698Top 3%
📍 Sunnyvale, CA: #963 of 14,302 inventorsTop 7%
🗺 California: #21,822 of 386,348 inventorsTop 6%
Overall (All Time): #163,929 of 4,157,543Top 4%
25
Patents All Time

Issued Patents All Time

Showing 1–25 of 25 patents

Patent #TitleCo-InventorsDate
9996651 Mask creation with hierarchy management using cover cells Weidong Zhang 2018-06-12
9448481 Generalization of shot definitions for mask and wafer writing tools Steffen Schulze 2016-09-20
9292643 Mask creation with hierarchy management using cover cells Weidong Zhang 2016-03-22
9134616 Generalization of shot definitions for mask and wafer writing tools Steffen Schulze 2015-09-15
8930856 Mask rule checking based on curvature 2015-01-06
8826196 Integration of optical proximity correction and mask data preparation 2014-09-02
8713483 IC layout parsing for multiple masks Alexander Tritchkov, Le Hong 2014-04-29
8640059 Forming separation directives using a printing feasibility analysis Alexander Tritchkov 2014-01-28
8635562 Data flow branching in mask data preparation 2014-01-21
8560981 Segmenting integrated circuit layout design files using speculative parsing 2013-10-15
8516401 Mask model calibration technologies involving etch effect and exposure effect Yuanfang Hu 2013-08-20
8234599 Use of graphs to decompose layout design data Petr E. Glotov 2012-07-31
7802226 Data preparation for multiple mask printing Jea-Woo Park 2010-09-21
7716624 Mask creation with hierarchy management using cover cells Weidong Zhang 2010-05-11
7367009 Convergence technique for model-based optical and process correction Nicolas B. Cobb 2008-04-29
7240321 Selective promotion for resolution enhancement techniques Nicolas B. Cobb, Laurence W. Grodd, George P. Lippincott 2007-07-03
7069534 Mask creation with hierarchy management using cover cells Weidong Zhang 2006-06-27
7028284 Convergence technique for model-based optical and process correction Nicolas B. Cobb 2006-04-11
7017141 Integrated verification and manufacturability tool Leigh Anderson, Nicolas B. Cobb, Laurence W. Grodd, Siqiong You 2006-03-21
6901574 Data management method for mask writing Patrick J. LaCour, Siqiong You 2005-05-31
6668367 Selective promotion for resolution enhancement techniques Nicolas B. Cobb, Laurence W. Grodd, George P. Lippincott 2003-12-23
6516459 Integrated circuit design correction using fragment correspondence 2003-02-04
6430737 Convergence technique for model-based optical and process correction Nicolas B. Cobb 2002-08-06
6425113 Integrated verification and manufacturability tool Leigh Anderson, Nicolas B. Cobb, Laurence W. Grodd 2002-07-23
6415421 Integrated verification and manufacturability tool Leigh Anderson, Nicolas B. Cobb, Laurence W. Grodd, Siqiong You 2002-07-02