Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7195931 | Split manufacturing method for advanced semiconductor circuits | Michael G. McIntyre | 2007-03-27 |
| 6452412 | Drop-in test structure and methodology for characterizing an integrated circuit process flow and topography | Iraj Emami, Charles E. May | 2002-09-17 |
| 6429452 | Test structure and methodology for characterizing ion implantation in an integrated circuit fabrication process | — | 2002-08-06 |
| 6362634 | Integrated defect monitor structures for conductive features on a semiconductor topography and method of use | Michael G. McIntyre | 2002-03-26 |
| 6297644 | Multipurpose defect test structure with switchable voltage contrast capability and method of use | Iraj Emami, John L. Nistler, Michael G. McIntyre | 2001-10-02 |
| 6294397 | Drop-in test structure and abbreviated integrated circuit process flow for characterizing production integrated circuit process flow, topography, and equipment | Iraj Emami, Charles E. May | 2001-09-25 |
| 6268717 | Semiconductor test structure with intentional partial defects and method of use | Iraj Emami, Alan Bruce Berezin | 2001-07-31 |
| 6258437 | Test structure and methodology for characterizing etching in an integrated circuit fabrication process | — | 2001-07-10 |
| 5773315 | Product wafer yield prediction method employing a unit cell approach | — | 1998-06-30 |