Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9996000 | Test pattern layout for test photomask and method for evaluating critical dimension changes | Brian N. Caldwell, Yuki Fujita, James P. Levin, Joseph L. Malenfant, Jr., Steven C. Nash | 2018-06-12 |
| 9989843 | Test pattern layout for test photomask and method for evaluating critical dimension changes | Brian N. Caldwell, Yuki Fujita, James P. Levin, Joseph L. Malenfant, Jr., Steven C. Nash | 2018-06-05 |
| 9372394 | Test pattern layout for test photomask and method for evaluating critical dimension changes | Brian N. Caldwell, Yuki Fujita, James P. Levin, Joseph L. Malenfant, Jr., Steven C. Nash | 2016-06-21 |
| 7496885 | Method of compensating for defective pattern generation data in a variable shaped electron beam system | Brian N. Caldwell, Daniel Sullivan | 2009-02-24 |
| 7198276 | Adaptive electrostatic pin chuck | Brian N. Caldwell, Louis M. Kindt | 2007-04-03 |