Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12112963 | Defect inspection apparatus and defect inspection program | Takashi Hiroi, Takahiro Urano | 2024-10-08 |
| 12039716 | Defect inspection method and defect inspection device | Takashi Hiroi, Takahiro Urano | 2024-07-16 |
| 11788973 | Defect inspection device and defect inspection method | Takashi Hiroi, Takahiro Urano | 2023-10-17 |
| 11041815 | Inspection information generation device, inspection information generation method, and defect inspection device | Takahiro Urano, Toshifumi Honda, Takashi Hiroi | 2021-06-22 |
| 8902417 | Inspection apparatus | Takahiro Jingu, Hidetoshi Nishiyama, Kazuo Takahashi, Hisashi Hatano | 2014-12-02 |
| 8564767 | Defect inspecting apparatus and defect inspecting method | Hideki Fukushima | 2013-10-22 |