Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10545490 | Method of inspecting a specimen and system thereof | Amit Batikoff, Efrat Rozenman, Ron Katzir, Imry Kissos | 2020-01-28 |
| 9851714 | Method of inspecting a specimen and system thereof | Amit Batikoff, Efrat Rozenman, Ron Katzir, Imry Kissos | 2017-12-26 |
| 9367911 | Apparatus and method for defect detection including patch-to-patch comparisons | Boris Sherman, Zion Hadad, Yehuda Udy Danino, Noga Bullkich | 2016-06-14 |
| 9098893 | System, method and computer program product for classification within inspection images | Gil Shabat, Adi Dafni, Amit Batikoff | 2015-08-04 |
| 8977035 | System, method and computer program product for detection of defects within inspection images | Gil Shabat, Adi Dafni, Amit Batikoff | 2015-03-10 |