Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7705302 | Scanning electron microscope | Yasuko Aoki, Tetsuya Sawahata, Atsushi Muto, Shuichi Takeuchi | 2010-04-27 |
| 7459683 | Charged particle beam device with DF-STEM image valuation method | Shunya Watanabe, Chisato Kamiya, Mitsugu Sato, Atsushi Takane, Akinari Morikawa +2 more | 2008-12-02 |