Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8625089 | Foreign matter inspection apparatus and foreign matter inspection method | Yoshio Bamba, Shigehisa Nozawa | 2014-01-07 |
| 8345233 | Inspection apparatus and inspection method | Tadashi Suga, Shuichi Chikamatsu, Takahiko Suzuki, Seiji Otani | 2013-01-01 |
| 8314930 | Inspection device and inspection method | Koichi Taniguchi, Shuichi Chikamatsu, Shigehisa Nozawa | 2012-11-20 |
| 8228496 | Defect inspection method and defect inspection apparatus | Shuichi Chikamatsu, Minori Noguchi, Kenji Aiko | 2012-07-24 |
| 8189185 | Optical inspection method and optical inspection system | Hideki Soeda | 2012-05-29 |
| 8102522 | Inspection apparatus and inspection method | Tadashi Suga, Shuichi Chikamatsu, Takahiko Suzuki, Seiji Otani | 2012-01-24 |
| 7953567 | Defect inspection apparatus and defect inspection method | Kei Shimura, Minori Noguchi, Masaaki Ito, Kenji Aiko, Shuichi Chikamatsu +4 more | 2011-05-31 |
| 7876431 | Foreign matter inspection apparatus and foreign matter inspection method | Yoshio Bamba, Shigehisa Nozawa | 2011-01-25 |
| 7869025 | Optical inspection method and optical inspection system | Hideki Soeda | 2011-01-11 |
| 7847927 | Defect inspection method and defect inspection apparatus | Shuichi Chikamatsu, Minori Noguchi, Kenji Aiko | 2010-12-07 |
| 7847928 | Inspection device and inspection method | Koichi Taniguchi, Shuichi Chikamatsu, Shigehisa Nozawa | 2010-12-07 |
| 7672799 | Defect inspection apparatus and defect inspection method | Kei Shimura, Minori Noguchi, Masaaki Ito, Kenji Aiko, Shuichi Chikamatsu +4 more | 2010-03-02 |
| 7589833 | Foreign matter inspection apparatus and foreign matter inspection method | Yoshio Bamba, Shigehisa Nozawa | 2009-09-15 |
| 5864409 | Image processing system providing access to data processing | Motokazu Kashida, Yasutomo Suzuki, Nobukuni Roppongi | 1999-01-26 |