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Antireflective structure and method |
Daty M. Rogers, Qizhi He, Wei William Lee |
2005-08-16 |
| 6753559 |
Transistor having improved gate structure |
Amitava Chatterjee, Wei William Lee, Greg Hames, Qizhi He, Iqbal Ali |
2004-06-22 |
| 6605482 |
Process for monitoring the thickness of layers in a microelectronic device |
Francis G. Celii, Katherine E. Violette, Rick L. Wise |
2003-08-12 |
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Transistor having an improved gate structure and method of construction |
Amitava Chatterjee, Wei William Lee, Greg Hames, Qizhi He, Iqbal Ali |
2002-08-20 |
| 6307230 |
Transistor having an improved sidewall gate structure and method of construction |
Amitava Chatterjee, Wei William Lee, Greg Hames, Quzhi He, Iqbal Ali |
2001-10-23 |
| 6117741 |
Method of forming a transistor having an improved sidewall gate structure |
Amitava Chatterjee, Wei William Lee, Greg Hames, Quzhi He, Iqbal Ali |
2000-09-12 |