Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11585853 | Trajectory-optimized test pattern generation for built-in self-test | Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer | 2023-02-21 |
| 9933485 | Deterministic built-in self-test based on compressed test patterns stored on chip and their derivatives | Grzegorz Mrugalski, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer | 2018-04-03 |