Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12215308 | Charged particle beam apparatus and cell evaluation method | Akira Ikeuchi, Shigeru Kawamata, Akira Sawaguchi | 2025-02-04 |
| 12170184 | Transmission electron microscope and inspection method using transmission electron microscope | Toshie Yaguchi, Keiji Tamura, Yasuyuki Nodera, Akiko Wakui, Keisuke Igarashi | 2024-12-17 |
| 12131882 | Charged particle beam device | Shuntaro ITO | 2024-10-29 |
| 11791131 | Charged particle beam apparatus and method for controlling charged particle beam apparatus | Takashi Dobashi, Hirokazu Tamaki, Shuntaro ITO | 2023-10-17 |
| 11756764 | Charged particle beam apparatus and method of controlling charged particle beam apparatus | Takashi Dobashi, Hirokazu Tamaki, Kuniyasu Nakamura | 2023-09-12 |
| 11742172 | Charged particle beam device and control method thereof | Takashi Dobashi, Hirokazu Tamaki | 2023-08-29 |
| 11321585 | Imaging device and morphological feature data display method | Yaku Maeda, Akira Ikeuchi, Shigeru Kawamata, Akira Sawaguchi | 2022-05-03 |
| 11268915 | Charged particle beam device, method for processing sample, and observation method | Tsunenori Nomaguchi | 2022-03-08 |