HS

Hak Chuah Sim

CI Corning Incorporated: 3 patents #1,382 of 3,867Top 40%
AT August Technology: 2 patents #5 of 19Top 30%
RT Rudolph Technologies: 2 patents #41 of 136Top 35%
BN Bruker Nano: 1 patents #76 of 148Top 55%
Overall (All Time): #622,949 of 4,157,543Top 15%
8
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11815349 Methods and systems for inspecting integrated circuits based on X-rays Brennan Peterson, Andrew George Reid, Nabil Farah Dawahre Olivieri 2023-11-14
9996766 Imaging-based methods for detecting and measuring defects in extruded cellular ceramic articles DiRisio Carlo Richard, Frey Julie Charmaine, Gehl Kristine Sluder, Russell Wayne Madara, Yeqing Zhang 2018-06-12
9897535 Optical reader systems and methods for microplate position detection Ronald Charles Hollenbeck, David Andrew Pastel, Cameron John Tovey, Cynthia L. Wida 2018-02-20
8810804 Optical reader systems and methods with rapid microplate position detection Ronald Charles Hollenbeck, Cameron John Tovey, Cynthia L. Wida 2014-08-19
7706599 Edge normal process 2010-04-27
7366344 Edge normal process 2008-04-29
7024031 System and method for inspection using off-angle lighting Ramiro Castellanos-Nolasco, Sanjeev Mathur, John Thornell, Thomas Casey Carrington, Clyde Maxwell Guest +1 more 2006-04-04
6947588 Edge normal process 2005-09-20