Nabil Farah Dawahre Olivieri

BN Bruker Nano: 1 patents #76 of 148Top 55%

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Showing 1–1 of 1 patents

Patent #	Title	Co-Inventors	Date
11815349	Methods and systems for inspecting integrated circuits based on X-rays	Brennan Peterson, Hak Chuah Sim, Andrew George Reid	2023-11-14