GS

Gurtej S. Sandhu

📍 Boise, ID: #269 of 3,546 inventorsTop 8%
🗺 Idaho: #362 of 8,810 inventorsTop 5%
Overall (All Time): #79,413 of 4,157,543Top 2%
40
Patents All Time

Issued Patents All Time

Showing 1–25 of 40 patents

Patent #TitleCo-InventorsDate
10943907 Integrated circuitry comprising an array, method of forming an array, method of forming DRAM circuitry, and method used in the fabrication of integrated circuitry Cornel Bozdog, Abhilasha Bhardwaj, Byeung Chul Kim, Michael E. Koltonski, Matthew Thorum 2021-03-09
10707211 Integrated circuitry comprising an array, method of forming an array, method of forming DRAM circuitry, and method used in the fabrication of integrated circuitry Cornel Bozdog, Abhilasha Bhardwaj, Byeung Chul Kim, Michael E. Koltonski, Matthew Thorum 2020-07-07
7939394 Multiple-depth STI trenches in integrated circuit fabrication Shubneesh Batra, Howard C. Kirsch, Xianfeng Zhou, Chih-Chen Cho 2011-05-10
7387940 Methods of forming trench isolation in the fabrication of integrated circuitry, methods of fabricating memory circuitry, integrated circuitry and memory integrated circuitry Robert D. Patraw, M. Ceredig Roberts, Keith R. Cook 2008-06-17
7354812 Multiple-depth STI trenches in integrated circuit fabrication Shubneesh Batra, Howard C. Kirsch, Xianfeng Zhou, Chih-Chen Cho 2008-04-08
7276442 Method for forming a metallization layer Chris C. Yu 2007-10-02
7116118 Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability Warren M. Farnworth, Malcolm Grief 2006-10-03
7098475 Apparatuses configured to engage a conductive pad Warren M. Farnworth, Malcolm Grief 2006-08-29
7026835 Engagement probe having a grouping of projecting apexes for engaging a conductive pad Warren M. Farnworth, Malcolm Grief 2006-04-11
6833727 Method and apparatus for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability Warren M. Farnworth, Malcolm Grief 2004-12-21
6700211 Method for forming conductors in semiconductor devices Fernando Gonzalez, Mike Violette 2004-03-02
6686758 Engagement probe and apparatuses configured to engage a conductive pad Warren M. Farnworth, Malcolm Grief 2004-02-03
6670819 Methods of engaging electrically conductive pads on a semiconductor substrate Warren M. Farnworth, Malcolm Grief 2003-12-30
6670713 Method for forming conductors in semiconductor devices Fernando Gonzalez, Mike Violette 2003-12-30
6657450 Methods of engaging electrically conductive test pads on a semiconductor substrate removable electrical interconnect apparatuses, engagement probes and removable engagement probes Warren M. Farnworth, Malcolm Grief 2003-12-02
6653733 Conductors in semiconductor devices Fernando Gonzalez, Mike Violette 2003-11-25
6614249 Methods of forming apparatuses and a method of engaging electrically conductive test pads on a semiconductor substrate Warren M. Farnworth, Malcolm Grief 2003-09-02
6573740 Method of forming an apparatus configured to engage an electrically conductive pad on a semiconductive substrate and a method of engaging electrically conductive pads on a semiconductive substrate Warren M. Farnworth, Malcolm Grief 2003-06-03
6563220 Method for forming conductors in semiconductor devices Fernando Gonzalez, Mike Violette 2003-05-13
6541809 Method of making straight wall containers and the resultant containers Ceredig Roberts 2003-04-01
6462571 Engagement probes Warren M. Farnworth, Malcolm Grief 2002-10-08
6392426 Methods of forming apparatuses and a method of engaging electrically conductive test pads on a semiconductor substrate Warren M. Farnworth, Malcolm Grief 2002-05-21
6380754 Removable electrical interconnect apparatuses including an engagement proble Warren M. Farnworth, Malcolm Grief 2002-04-30
6376284 Method of fabricating a memory device Fernando Gonzalez, Mike Violette 2002-04-23
6369431 Method for forming conductors in semiconductor devices Fernando Gonzalez, Mike Violette 2002-04-09