Issued Patents All Time
Showing 25 most recent of 47 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12316506 | Network management using hierarchical and multi-scenario graphs | Ulrich A. Finkler, Steven N. Hirsch, Mark A. Lavin, Jun Qu, Amith Singhee +1 more | 2025-05-27 |
| 11888698 | Network management using hierarchical and multi-scenario graphs | Ulrich A. Finkler, Steven N. Hirsch, Mark A. Lavin, Jun Qu, Amith Singhee +1 more | 2024-01-30 |
| 11620553 | System and method for forecasting leaks in a fluid-delivery pipeline network | Jefferson Huang, Tarun Kumar, Rui Zhang | 2023-04-04 |
| 11598900 | Weather-driven multi-category infrastructure impact forecasting | Zhiguo Li, Stuart A. Siegel, Amith Singhee, Haijing Wang | 2023-03-07 |
| 11349720 | Network management using hierarchical and multi-scenario graphs | Ulrich A. Finkler, Steven N. Hirsch, Mark A. Lavin, Jun Qu, Amith Singhee +1 more | 2022-05-31 |
| 11048021 | Weather-driven multi-category infrastructure impact forecasting | Zhiguo Li, Stuart A. Siegel, Amith Singhee, Haijing Wang | 2021-06-29 |
| 10989838 | Weather-driven multi-category infrastructure impact forecasting | Zhiguo Li, Stuart A. Siegel, Amith Singhee, Haijing Wang | 2021-04-27 |
| 10574533 | Network management using hierarchical and multi-scenario graphs | Ulrich A. Finkler, Steven N. Hirsch, Mark A. Lavin, Jun Qu, Amith Singhee +1 more | 2020-02-25 |
| 10521525 | Quantifying a combined effect of interdependent uncertain resources in an electrical power grid | Aanchal Goyal, Younghun Kim, Tarun Kumar, Mark A. Lavin, Srivats Shukla +2 more | 2019-12-31 |
| 10387802 | Weather-driven multi-category infrastructure impact forecasting | Zhiguo Li, Stuart A. Siegel, Amith Singhee, Haijing Wang | 2019-08-20 |
| 9893948 | Network management using hierarchical and multi-scenario graphs | Ulrich A. Finkler, Steven N. Hirsch, Mark A. Lavin, Jun Qu, Amith Singhee +1 more | 2018-02-13 |
| 9882782 | Network management using hierarchical and multi-scenario graphs | Ulrich A. Finkler, Steven N. Hirsch, Mark A. Lavin, Jun Qu, Amith Singhee +1 more | 2018-01-30 |
| 9536214 | Weather-driven multi-category infrastructure impact forecasting | Zhiguo Li, Stuart A. Siegel, Amith Singhee, Haijing Wang | 2017-01-03 |
| 8880382 | Analyzing a patterning process using a model of yield | Saeed Bagheri, Rajiv V. Joshi, Kafai Lai, David O. Melville, Saibal Mukhopadhyay +3 more | 2014-11-04 |
| 8682634 | Analyzing a patterning process using a model of yield | Saeed Bagheri, Rajiv V. Joshi, Kafai Lai, David O. Melville, Saibal Mukhopadhyay +3 more | 2014-03-25 |
| 8522173 | Spatial correlation-based estimation of yield of integrated circuits | Alexey Y. Lvov, Amith Singhee | 2013-08-27 |
| 8473885 | Physical design system and method | John M. Cohn, James A. Culp, Ulrich A. Finkler, Mark A. Lavin, Jin-Fuw Lee +6 more | 2013-06-25 |
| 8464189 | Technology migration for integrated circuits with radical design restrictions | Robert J. Allen, Cam V. Endicott, Jason D. Hibbeler, Kevin W. McCullen, Rani Narayan +2 more | 2013-06-11 |
| 8423328 | Method of distributing a random variable using statistically correct spatial interpolation continuously with spatially inhomogeneous statistical correlation versus distance, standard deviation, and mean | John M. Cohn, Ulrich A. Finkler, David J. Hathaway, Jeffrey G. Hemmett, Jason D. Hibbeler +3 more | 2013-04-16 |
| 8423941 | Structural migration of integrated circuit layout | Rajiv V. Joshi, Alexey Y. Lvov, Xiaoping Tang | 2013-04-16 |
| 8276102 | Spatial correlation-based estimation of yield of integrated circuits | Alexey Y. Lvov, Amith Singhee | 2012-09-25 |
| 8219943 | Physical design system and method | John M. Cohn, James A. Culp, Ulrich A. Finkler, Mark A. Lavin, Jin-Fuw Lee +6 more | 2012-07-10 |
| 8122387 | Optimizing integrated circuit chip designs for optical proximity correction | Geng Han, Jin-Fuw Lee, Rama N. Singh | 2012-02-21 |
| 8108803 | Geometry based electrical hotspot detection in integrated circuit layouts | Xu Ouyang, Yunsheng Song, Yun-Yu Wang | 2012-01-31 |
| 8020120 | Layout quality gauge for integrated circuit design | Mark A. Lavin, Jin-Fuw Lee, Thomas Ludwig, Rama Nand Sing, Fanchieh Yee | 2011-09-13 |