Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10444282 | Test point insertion for low test pattern counts | Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer, Justyna Zawada | 2019-10-15 |
| 10361873 | Test point-enhanced hardware security | Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer, Justyna Zawada | 2019-07-23 |
| 9651622 | Isometric test compression with low toggling activity | Janusz Rajski, Amit Amar Kumar, Mark Kassab, Nilanjan Mukherjee, Jerzy Tyszer +1 more | 2017-05-16 |
| 8499209 | At-speed scan testing with controlled switching activity | Janusz Rajski, Nilanjan Mukherjee, Mark Kassab, Xijiang Lin | 2013-07-30 |