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Method and apparatus for reducing plasma process induced damage in integrated circuits |
Heather McCulloh, Denis Finbarr O'Connell, Sergei Drizlikh |
2013-06-25 |
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Method for designing and manufacturing a PMOS device with drain junction breakdown point located for reduced drain breakdown voltage walk-in |
Andrew Strachan |
2011-12-27 |
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Method of monitoring process misalignment to reduce asymmetric device operation and improve the electrical and hot carrier performance of LDMOS transistor arrays |
Prasad Chaparala |
2010-05-18 |
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MOS transistor and method of forming the MOS transistor with a SiON etch stop layer that protects the transistor from PID and hot carrier degradation |
Prasad Chaparala, Denis Finbarr O'Connell, Heather McCulloh, Sergei Drizlikh |
2010-01-12 |
| 7560348 |
Method for designing and manufacturing a PMOS device with drain junction breakdown point located for reduced drain breakdown voltage walk-in |
Andrew Strachan |
2009-07-14 |
| 7214992 |
Multi-source, multi-gate MOS transistor with a drain region that is wider than the source regions |
Andy Strachan |
2007-05-08 |
| 7180140 |
PMOS device with drain junction breakdown point located for reduced drain breakdown voltage walk-in and method for designing and manufacturing such device |
Andrew Strachan |
2007-02-20 |
| 6946706 |
LDMOS transistor structure for improving hot carrier reliability |
David Tsuei, Alexander H. Owens, Andy Strachan |
2005-09-20 |
| 6903979 |
Efficient method of PMOS stacked-gate memory cell programming utilizing feedback control of substrate current |
Yuri Mirgorodski, Vladislav Vashchenko, Peter J. Hopper |
2005-06-07 |
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Method and device for improving hot carrier reliability of an LDMOS transistor using drain ring over-drive bias |
Andy Strachan |
2004-04-27 |
| 6566710 |
Power MOSFET cell with a crossed bar shaped body contact area |
Andy Strachan |
2003-05-20 |
| 6548839 |
LDMOS transistor structure using a drain ring with a checkerboard pattern for improved hot carrier reliability |
Andrew Strachan |
2003-04-15 |