AS

Andy Strachan

NS National Semiconductor: 26 patents #45 of 2,238Top 3%
TI Texas Instruments: 1 patents #7,357 of 12,488Top 60%
Overall (All Time): #146,335 of 4,157,543Top 4%
27
Patents All Time

Issued Patents All Time

Showing 25 most recent of 27 patents

Patent #TitleCo-InventorsDate
9865584 Contact array optimization for ESD devices He Lin, Kun-Ming Chen, Chao-Wei Wu, Dening Wang, Lily Springer +1 more 2018-01-09
7989883 System and method for providing a poly cap and a no field oxide area to prevent formation of a vertical bird's beak structure in the manufacture of a semiconductor device Charles A. Dark 2011-08-02
7960998 Electrical test structure and method for characterization of deep trench sidewall reliability Lisa V. Rozario, Richard Orr 2011-06-14
7867871 System and method for increasing breakdown voltage of LOCOS isolated devices Richard W. Foote, Terry Lines, Alexei Sadovnikov 2011-01-11
7714355 Method of controlling the breakdown voltage of BSCRs and BJT clamps Vladislav Vashchenko, Alexei Sadovnikov, Peter J. Hopper 2010-05-11
7507607 Method of forming a silicide bridged anti-fuse with a tungsten plug metalization process Charles A. Dark, William M. Coppock, Jeffery Lee Nilles 2009-03-24
7488647 System and method for providing a poly cap and a no field oxide area to prevent formation of a vertical bird's beak structure in the manufacture of a semiconductor device Charles A. Dark 2009-02-10
7479435 Method of forming a circuit having subsurface conductors Peter J. Hopper, Vladislav Vashchenko, Philipp Lindorfer 2009-01-20
7298159 Method of measuring the leakage current of a deep trench isolation structure Lisa V. Rozario 2007-11-20
7238553 Method of forming a high-voltage silicon controlled rectifier structure with improved punch through resistance Vladislav Vashchenko, Peter J. Hopper, Philipp Lindorfer 2007-07-03
7214992 Multi-source, multi-gate MOS transistor with a drain region that is wider than the source regions Douglas Brisbin 2007-05-08
7192857 Method of forming a semiconductor structure with non-uniform metal widths Peter J. Hopper, Philipp Lindorfer, Vladislav Vashchenko 2007-03-20
7105373 Vertical photodiode with heavily-doped regions of alternating conductivity types Peter J. Hopper, Philipp Lindorfer, Vladislav Vashchenko 2006-09-12
7037814 Single mask control of doping levels Vladislav Vashchenko, Peter J. Hopper, Philipp Lindorfer 2006-05-02
6979879 Trim zener using double poly process Wipawan Yindeepol 2005-12-27
6946706 LDMOS transistor structure for improving hot carrier reliability Douglas Brisbin, David Tsuei, Alexander H. Owens 2005-09-20
6933562 Power transistor structure with non-uniform metal widths Peter J. Hopper, Philipp Lindorfer, Vladislav Vashchenko 2005-08-23
6919588 High-voltage silicon controlled rectifier structure with improved punch through resistance Vladislav Vashchenko, Peter J. Hopper, Philipp Lindorfer 2005-07-19
6864582 Semiconductor interconnect and method of providing interconnect using a contact region Vladislav Vashchenko, Peter J. Hopper, Philipp Lindorfer, Peter Johnson 2005-03-08
6844585 Circuit and method of forming the circuit having subsurface conductors Peter J. Hopper, Vladislav Vashchenko, Philipp Lindorfer 2005-01-18
6815797 Silicide bridged anti-fuse Charles A. Dark, William M. Coppock, Jeffery Lee Nilles 2004-11-09
6806529 Memory cell with a capacitive structure as a control gate and method of forming the memory cell Peter J. Hopper, Yuri Mirgorodski 2004-10-19
6727547 Method and device for improving hot carrier reliability of an LDMOS transistor using drain ring over-drive bias Douglas Brisbin 2004-04-27
6639784 Wedge-shaped high density capacitor and method of making the capacitor Peter J. Hopper, Philipp Lindorfer, Kyuwoon Hwang, Vladislav Vashchenko 2003-10-28
6586317 Method of forming a zener diode in a npn and pnp bipolar process flow that requires no additional steps to set the breakdown voltage Vladislav Vashchenko, Peter J. Hopper 2003-07-01