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Semiconductor passivation deposition process for interfacial adhesion |
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2007-04-10 |
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Wafer level electro-optical sort testing and wafer level assembly of micro liquid crystal-on silicon (LCOS) devices |
John Magana |
2005-05-10 |
| 6515358 |
Integrated passivation process, probe geometry and probing process |
Kenneth D. Karklin, Krishna Seshan, Amir Roggel |
2003-02-04 |
| 6357330 |
Method and apparatus for cutting a wafer |
Isaura S. Gaeta, Krishna Seshan |
2002-03-19 |
| 6352940 |
Semiconductor passivation deposition process for interfacial adhesion |
Krishna Seshan, Geoffrey Bakker |
2002-03-05 |
| 6162652 |
Process for sort testing C4 bumped wafers |
Amir Roggel, Krishna Seshan |
2000-12-19 |
| 6143668 |
KLXX technology with integrated passivation process, probe geometry and probing process |
Kenneth D. Karklin, Krishna Seshan, Amir Roggel |
2000-11-07 |
| 6046101 |
Passivation technology combining improved adhesion in passivation and a scribe street without passivation |
Krishna Seshan, Isaura S. Gaeta |
2000-04-04 |
| 5536684 |
Process for formation of epitaxial cobalt silicide and shallow junction of silicon |
Peng Cheng, David B. Fraser |
1996-07-16 |