Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6759858 | Integrated circuit test probe having ridge contact | — | 2004-07-06 |
| 6515358 | Integrated passivation process, probe geometry and probing process | M. Lawrence A. Dass, Kenneth D. Karklin, Krishna Seshan | 2003-02-04 |
| 6162652 | Process for sort testing C4 bumped wafers | M. Lawrence A. Dass, Krishna Seshan | 2000-12-19 |
| 6143668 | KLXX technology with integrated passivation process, probe geometry and probing process | M. Lawrence A. Dass, Kenneth D. Karklin, Krishna Seshan | 2000-11-07 |