Issued Patents All Time
Showing 101–125 of 137 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8557677 | Stack-type semiconductor device and method for manufacturing the same | Huicai Zhong, Chao Zhao, Huilong Zhu | 2013-10-15 |
| 8525188 | Shallow trench isolation structure and method for forming the same | Huicai Zhong, Haizhou Yin | 2013-09-03 |
| 8513780 | Semiconductor device having inter-level dielectric layer with hole-sealing and method for manufacturing the same | Huicai Zhong | 2013-08-20 |
| 8513742 | Method for manufacturing contact and semiconductor device having said contact | Huicai Zhong | 2013-08-20 |
| 8513085 | Structure and method to improve threshold voltage of MOSFETs including a high k dielectric | Sunfei Fang, Brian J. Greene, Effendi Leobandung, Edward P. Maciejewski, Yanfeng Wang | 2013-08-20 |
| 8492247 | Programmable FETs using Vt-shift effect and methods of manufacture | Eduard A. Cartier, Yue Liang, Yanfeng Wang | 2013-07-23 |
| 8492206 | Semiconductor device structure and method for manufacturing the same | Huicai Zhong, Jun Luo, Huilong Zhu | 2013-07-23 |
| 8492210 | Transistor, semiconductor device comprising the transistor and method for manufacturing the same | Huilong Zhu, Huicai Zhong | 2013-07-23 |
| 8492842 | Method for forming retrograded well for MOSFET | Huilong Zhu, Zhijiong Luo, Haizhou Yin | 2013-07-23 |
| 8481379 | Method for manufacturing fin field-effect transistor | Huilong Zhu, Huicai Zhong | 2013-07-09 |
| 8466500 | Semiconductor device and method for manufacturing the same | Huilong Zhu, Haizhou Yin, Zhijiong Luo | 2013-06-18 |
| 8460988 | Method for manufacturing semiconductor device | Huicai Zhong | 2013-06-11 |
| 8456169 | High speed measurement of random variation/yield in integrated circuit device testing | Manjul Bhushan, Mark B. Ketchen, Edward P. Maciejewski | 2013-06-04 |
| 8455323 | Method for manufacturing semiconductor wafer | Huicai Zhong, Chao Zhao | 2013-06-04 |
| 8441045 | Semiconductor device and method for manufacturing the same | Huilong Zhu, Haizhou Yin, Zhijiong Luo | 2013-05-14 |
| 8440532 | Structure and method for making metal semiconductor field effect transistor (MOSFET) with isolation last process | Huilong Zhu, Zhijiong Luo, Haizhou Yin | 2013-05-14 |
| 8426920 | MOSFET and method for manufacturing the same | Huilong Zhu, Haizhou Yin, Zhijiong Luo | 2013-04-23 |
| 8420492 | MOS transistor and method for forming the same | Huicai Zhong, Da Yang, Chao Zhao | 2013-04-16 |
| 8410609 | Semiconductor device having carbon nanotube interconnects contact deposited with different orientation and method for manufacturing the same | Huicai Zhong, Zhijiong Luo, Huilong Zhu | 2013-04-02 |
| 8367490 | Semiconductor structure and method for manufacturing the same | Huilong Zhu, Haizhou Yin, Zhijiong Luo | 2013-02-05 |
| 8343818 | Method for forming retrograded well for MOSFET | Huilong Zhu, Zhijiong Luo, Haizhou Yin | 2013-01-01 |
| 8278721 | Contact hole, semiconductor device and method for forming the same | Huicai Zhong | 2012-10-02 |
| 8269307 | Shallow trench isolation structure and method for forming the same | Huicai Zhong, Haizhou Yin, Huilong Zhu | 2012-09-18 |
| 8173531 | Structure and method to improve threshold voltage of MOSFETS including a high K dielectric | Sunfei Fang, Brian J. Greene, Effendi Leobandung, Edward P. Maciejewski, Yanfeng Wang | 2012-05-08 |
| 8169026 | Stress-induced CMOS device | Zhijiong Luo, Haizhou Yin, Huilong Zhu | 2012-05-01 |