| 8935586 |
Staggered start of BIST controllers and BIST engines |
Valarie H. Chickanosky, Kevin W. Gorman, Michael R. Ouellette, Nancy H. Pratt, Michael A. Ziegerhofer |
2015-01-13 |
| 8612813 |
Circuit and method for efficient memory repair |
Valerie H. Chickanosky, Kevin W. Gorman, Michael R. Ouellette |
2013-12-17 |
| 8452566 |
Warranty monitoring and enforcement for integrated circuit and related design structure |
Kenneth J. Goodnow, Eze Kamanu, Todd E. Leonard, Ramnath Ravindran, Kyle E. Schneider +1 more |
2013-05-28 |
| 8407633 |
Dynamically reconfigurable self-monitoring circuit |
Adam J. Courchesne, Jonathan P. Ebbers, Kenneth J. Goodnow, Eze Kamanu, Kyle E. Schneider +1 more |
2013-03-26 |
| 8381052 |
Circuit and method for efficient memory repair |
Valerie H. Chickanosky, Kevin W. Gorman, Michael R. Ouellette |
2013-02-19 |
| 8103998 |
Verifying non-deterministic behavior of a design under test |
Jesse E. Craig, Francis A. Kampf, Barbara L. Powers |
2012-01-24 |
| 7831879 |
Generating test coverage bin based on simulation result |
Bruce J. Ditmyer, Susan Farmer Bueti, Jonathan P. Ebbers, Francis A. Kampf, Barbara L. Powers +1 more |
2010-11-09 |
| 7360138 |
Verification of the design of an integrated circuit background |
Jesse E. Craig, Francis A. Kampf, Barbara L. Powers |
2008-04-15 |
| 7251794 |
Simulation testing of digital logic circuit designs |
Rafael Blanco, Francis A. Kampf, Douglas Thomas Massey |
2007-07-31 |
