Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7831879 | Generating test coverage bin based on simulation result | Susan Farmer Bueti, Jonathan P. Ebbers, Suzanne Granato, Francis A. Kampf, Barbara L. Powers +1 more | 2010-11-09 |
| 5039939 | Calculating AC chip performance using the LSSD scan path | Carroll J. Dick, Thomas L. Jeremiah, Lawrence W. Jones, Gregory S. Still | 1991-08-13 |