Issued Patents All Time
Showing 26–45 of 45 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9280630 | Modified standard cells to address fast paths | Daniel Lewis, Adarsh Subramanya | 2016-03-08 |
| 9064071 | Usage-based temporal degradation estimation for memory elements | Aditya Bansal, Jae-Joon Kim | 2015-06-23 |
| 9058448 | Usage-based temporal degradation estimation for memory elements | Aditya Bansal, Jae-Joon Kim | 2015-06-16 |
| 8966420 | Estimating delay deterioration due to device degradation in integrated circuits | Aditya Bansal, Jae-Joon Kim | 2015-02-24 |
| 8526219 | Enhanced static random access memory stability using asymmetric access transistors and design structure for same | Aditya Bansal, Ching-Te Chuang, Jae-Joon Kim, Shih-Hsien Lo | 2013-09-03 |
| 8493774 | Performing logic functions on more than one memory cell within an array of memory cells | Jente B. Kuang | 2013-07-23 |
| 8456247 | Monitoring negative bias temperature instability (NBTI) and/or positive bias temperature instability (PBTI) | Jae-Joon Kim | 2013-06-04 |
| 8139400 | Enhanced static random access memory stability using asymmetric access transistors and design structure for same | Aditya Bansal, Ching-Te Chuang, Jae-Joon Kim, Shih-Hsien Lo | 2012-03-20 |
| 8004305 | Electronic circuit for measurement of transistor variability and the like | Keith A. Jenkins, Jae-Joon Kim | 2011-08-23 |
| 7882370 | Static pulsed bus circuit and method having dynamic power supply rail selection | Harmander Singh Deogun, Kevin John Nowka, Robert M. Senger | 2011-02-01 |
| 7764080 | Methods of operating an electronic circuit for measurement of transistor variability and the like | Keith A. Jenkins, Jae-Joon Kim | 2010-07-27 |
| 7746709 | Memory circuit with decoupled read and write bit lines and improved write stability | Rajiv V. Joshi, Jae-Joon Kim | 2010-06-29 |
| 7642864 | Circuits and design structures for monitoring NBTI (negative bias temperature instability) effect and/or PBTI (positive bias temperature instability) effect | Ching-Te Chuang, Jae-Joon Kim, Tae H. Kim, Pong-Fei Lu, Saibal Mukhopadhyay +1 more | 2010-01-05 |
| 7550987 | Method and circuit for measuring operating and leakage current of individual blocks within an array of test circuit blocks | Dhruva J. Acharyya, Sani R. Nassif | 2009-06-23 |
| 7548822 | Apparatus and method for determining the slew rate of a signal produced by an integrated circuit | Ching-Te Chuang, Amlan Ghosh, Jae-Joon Kim | 2009-06-16 |
| 7495969 | Techniques for improving write stability of memory with decoupled read and write bit lines | Rajiv V. Joshi, Jae-Joon Kim | 2009-02-24 |
| 7439755 | Electronic circuit for measurement of transistor variability and the like | Keith A. Jenkins, Jae-Joon Kim | 2008-10-21 |
| 7241479 | Thermal CVD synthesis of nanostructures | Apparao M. Rao | 2007-07-10 |
| 7088141 | Multi-threshold complementary metal-oxide semiconductor (MTCMOS) bus circuit and method for reducing bus power consumption via pulsed standby switching | Harmander Singh Deogun, Kevin John Nowka | 2006-08-08 |
| 6791361 | Technique for mitigating gate leakage during a sleep state | Elad Alon, Jeffrey L. Burns, Kevin John Nowka | 2004-09-14 |