Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9831139 | Test structure and method of manufacturing structure including the same | Shaofeng Ding, Jeong Hoon Ahn | 2017-11-28 |
| 7615432 | HDP/PECVD methods of fabricating stress nitride structures for field effect transistors | Jae-Eun Park, Ja-Hum Ku, Daewon Yang | 2009-11-10 |
| 7521308 | Dual layer stress liner for MOSFETS | Deleep R. Nair, Christopher V. Baiocco, Xiangdong Chen, Jae-Eun Park, Daewon Yang | 2009-04-21 |
| 7393746 | Post-silicide spacer removal | Thomas W. Dyer, Sunfei Fang, Jiang Yan, Siddhartha Panda, Yong Meng Lee | 2008-07-01 |