JD

James Dawson

IBM: 16 patents #6,952 of 70,183Top 10%
EL Eaton Intelligent Power Limited: 15 patents #48 of 2,212Top 3%
RP Royal Precision Products: 5 patents #1 of 8Top 15%
BR Brunswick: 1 patents #737 of 1,301Top 60%
YA Yazaki: 1 patents #108 of 211Top 55%
📍 Carol Stream, IL: #5 of 346 inventorsTop 2%
🗺 Illinois: #1,346 of 84,256 inventorsTop 2%
Overall (All Time): #83,746 of 4,157,543Top 3%
38
Patents All Time

Issued Patents All Time

Showing 26–38 of 38 patents

Patent #TitleCo-InventorsDate
7176725 Fast pulse powered NOR decode apparatus for semiconductor devices Donald W. Plass, Kenneth J. Reyer 2007-02-13
7170320 Fast pulse powered NOR decode apparatus with pulse stretching and redundancy steering Thomas J. Knips, Donald W. Plass, Kenneth J. Reyer 2007-01-30
7099206 High density bitline selection apparatus for semiconductor memory devices Donald W. Plass, Kenneth J. Reyer 2006-08-29
7088638 Global and local read control synchronization method and system for a memory array configured with multiple memory subarrays Paul A. Bunce, John D. Davis, Donald W. Plass 2006-08-08
7076710 Non-binary address generation for ABIST Thomas J. Knips, Tom Chang, Douglas J. Malone 2006-07-11
7073105 ABIST address generation Thomas J. Knips, John D. Davis, Douglas J. Malone 2006-07-04
7068554 Apparatus and method for implementing multiple memory redundancy with delay tracking clock Thomas J. Knips, Donald W. Plass, Kenneth J. Reyer 2006-06-27
7064990 Method and apparatus for implementing multiple column redundancy for memory Thomas J. Knips, Donald W. Plass, Kenneth J. Reyer 2006-06-20
6728912 SOI cell stability test method Paul A. Bunce, Donald W. Plass 2004-04-27
5313424 Module level electronic redundancy Robert Dean Adams, Henry A. Bonges, III, Erik L. Hedberg 1994-05-17
5206583 Latch assisted fuse testing for customized integrated circuits George A. DeLuca, Michael Nicewicz 1993-04-27
4995001 Memory cell and read circuit Panagiotis A. Phillips 1991-02-19
4644680 Transmitter rod 1987-02-24