Issued Patents All Time
Showing 26–28 of 28 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5552718 | Electrical test structure and method for space and line measurement | Michael S. Hibbs, Robert K. Leidy | 1996-09-03 |
| 4978594 | Fluorine-containing base layer for multi-layer resist processes | Michael L. Kerbaugh, Ranee W. Kwong, Tanya N. Lee, Harold G. Linde, Harbans S. Sachdev | 1990-12-18 |
| 4612805 | Adhesion characterization test site | Rajesh G. Narechania | 1986-09-23 |