YK

Yukihiro Kumagai

HI Hitachi: 8 patents #5,191 of 28,497Top 20%
RT Renesas Technology: 5 patents #592 of 3,337Top 20%
HD Hitachi Power Semiconductor Device: 1 patents #36 of 79Top 50%
RE Renesas Electronics: 1 patents #2,739 of 4,529Top 65%
TT Trecenti Technologies: 1 patents #5 of 22Top 25%
📍 Chiyoda, JP: #259 of 1,712 inventorsTop 20%
Overall (All Time): #323,642 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDate
9076774 Semiconductor device and a method of manufacturing same Michiaki Hiyoshi 2015-07-07
7906848 Semiconductor device Hiroyuki Ohta, Naotaka Tanaka, Masahiko Fujisawa, Akihiko Ohsaki 2011-03-15
7244643 Semiconductor device and manufacturing method thereof Norio Ishitsuka, Hideo Miura, Shuji Ikeda, Toshifumi Takeda, Hiroyuki Ohta 2007-07-17
7205617 Semiconductor device including active regions and gate electrodes for field effect transistors, with a trench formed between the active regions Hiroyuki Ohta, Yasuo Sonobe, Kousuke Ishibashi, Yasushi Tainaka, Masafumi Miyamoto +1 more 2007-04-17
7196395 Semiconductor device and manufacturing method Hideo Miura, Hiroyuki Ohta, Michihiro Mishima, Katsuyuki Nakanishi 2007-03-27
7193270 Semiconductor device with a vertical transistor Hiroyuki Ohta, Masahiro Moniwa, Shingo Nasu 2007-03-20
7109568 Semiconductor device including n-channel fets and p-channel fets with improved drain current characteristics Hiroyuki Ohta, Shingo Nasu 2006-09-19
7009279 Semiconductor device configured for suppressed germanium diffusion from a germanium-doped regions and a method for fabrication thereof Shingo Nasu, Tomio Iwasaki, Hiroyuki Ohta, Shuji Ikeda 2006-03-07
6982465 Semiconductor device with CMOS-field-effect transistors having improved drain current characteristics Hiroyuki Ohta, Fumio Ootsuka, Shuji Ikeda, Takahiro Onai, Hideo Miura +2 more 2006-01-03
6965140 Semiconductor device including storage capacitor Hideo Miura, Hiroyuki Ohta, Tomio Iwasaki, Isamu Asano 2005-11-15
6891761 Semiconductor device and manufacturing method Hideo Miura, Hiroyuki Ohta, Michihiro Mishima, Katsuyuki Nakanishi 2005-05-10
6720603 CAPACITOR STRUCTURE AND A SEMICONDUCTOR DEVICE WITH A FIRST METAL LAYER, A SECOND METAL SILICIDE LAYER FORMED OVER THE FIRST METAL LAYER AND A SECOND METAL LAYER FORMED OVER THE SECOND METAL SILICIDE LAYER Shinpei Iijima, Yuzuru Ohji, Masato Kunitomo, Masahiko Hiratani, Yuichi Matsui +1 more 2004-04-13
6639263 Semiconductor device with copper wiring connected to storage capacitor Hideo Miura, Hiroyuki Ohta, Tomio Iwasaki, Isamu Asano 2003-10-28
6534375 METHOD OF FORMING A CAPACITOR IN A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE USING A METAL SILICON NITRIDE LAYER TO PROTECT AN UNDERLYING METAL SILICIDE LAYER FROM OXIDATION DURING SUBSEQUENT PROCESSING STEPS Shinpei Iijima, Yuzuru Ohji, Masato Kunitomo, Masahiko Hiratani, Yuichi Matsui +1 more 2003-03-18
6521932 Semiconductor device with copper wiring connected to storage capacitor Hideo Miura, Hiroyuki Ohta, Tomio Iwasaki, Isamu Asano 2003-02-18