IM

Isao Miyazaki

HI Hitachi: 10 patents #4,206 of 28,497Top 15%
KT Kabushiki Kaisha Toshiba: 2 patents #9,982 of 21,451Top 50%
HC Hitachi Instruments Engineering Co.: 1 patents #18 of 126Top 15%
HC Hitachi Engineering Co.: 1 patents #187 of 572Top 35%
NI Ngk Insulators: 1 patents #1,271 of 2,083Top 65%
RT Renesas Technology: 1 patents #1,991 of 3,337Top 60%
TL Teijin Limited: 1 patents #850 of 1,631Top 55%
Overall (All Time): #326,854 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDate
7304001 Fabrication methods of semiconductor integrated circuit device and photomask Yasushi Takeuchi, Toshihiro Morii, Koji Sekiguchi, Yoshihiko Okamoto 2007-12-04
7052842 Method for highly sensitive hybridization of nucleic acids, and method for gene analysis using the same Mitsuo Kawase, Kazunari Yamada, Chiho Matsuda 2006-05-30
6757621 Process management system Fumio Mizuno, Seiji Isogai, Kenji Watanabe, Yasuhiro Yoshitake, Terushige Asakawa +12 more 2004-06-29
6628817 Inspection data analyzing system Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Hiroto Nagatomo +10 more 2003-09-30
6542830 Process control system Fumio Mizuno, Seiji Isogai, Kenji Watanabe, Yasuhiro Yoshitake, Terushige Asakawa +12 more 2003-04-01
6529619 Inspection data analyzing system Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Hiroto Nagatomo +10 more 2003-03-04
6404911 Semiconductor failure analysis system Kazuko Ishihara, Seiji Ishikawa, Masao Sakata, Yoshiyuki Miyamoto, Jun Nakazato 2002-06-11
6339653 Inspection data analyzing system Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Hiroto Nagatomo +10 more 2002-01-15
6330352 Inspection data analyzing system Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Hiroto Nagatomo +10 more 2001-12-11
6272917 Draw-false twisting management system Bunji Hamasu, Katsushi Kikuchi 2001-08-14
6185322 Inspection system and method using separate processors for processing different information regarding a workpiece such as an electronic device Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Hiroto Nagatomo +10 more 2001-02-06
6185324 Semiconductor failure analysis system Kazuko Ishihara, Seiji Ishikawa, Masao Sakata, Yoshiyuki Miyamoto, Jun Nakazato 2001-02-06
5841893 Inspection data analyzing system Seiji Ishikawa, Masao Sakata, Jun Nakazato, Sadao Shimoyashiro, Hiroto Nagatomo +10 more 1998-11-24
5715020 Remote control system in which a plurality of remote control units are managed by a single remote control device Wataru Kuroiwa, Shinichi Ooi, Yasushi Odagiri, Masahiro Takahashi 1998-02-03
5619251 Two-way CATV system and remote control system Wataru Kuroiwa, Shinichi Ooi, Yasushi Odagiri, Masahiro Takahashi 1997-04-08