Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12270768 | Method of processing a cleaved semiconductor wafer | Benjamin Michael Meyer, Justin Scott Kayser, James Dean Eoff, Vandan Tanna, William L. Luter | 2025-04-08 |
| 12019031 | Cleaved semiconductor wafer imaging system | Benjamin Michael Meyer, Justin Scott Kayser, James Dean Eoff, Vandan Tanna, William L. Luter | 2024-06-25 |
| 11921054 | Cleaved semiconductor wafer camera system | Benjamin Michael Meyer, Justin Scott Kayser, James Dean Eoff, Vandan Tanna, William L. Luter | 2024-03-05 |
| 10910280 | Methods for separating bonded wafer structures | Justin Scott Kayser, James Dean Eoff | 2021-02-02 |
| 10679908 | Cleave systems, mountable cleave monitoring systems, and methods for separating bonded wafer structures | Justin Scott Kayser, James Dean Eoff | 2020-06-09 |
| 10636136 | Wafer nanotopography metrology for lithography based on thickness maps | — | 2020-04-28 |
| 10062158 | Wafer nanotopography metrology for lithography based on thickness maps | — | 2018-08-28 |
| 10030964 | Systems and methods for performing phase shift interferometry while a wafer is vibrating | Benno Orschel, Andrey Melnikov, Markus Jan Peter Siegert | 2018-07-24 |
| 9665931 | Air pocket detection methods and systems | — | 2017-05-30 |
| 9317912 | Symmetry based air pocket detection methods and systems | — | 2016-04-19 |
| 7324917 | Method, system, and software for evaluating characteristics of a surface with reference to its edge | Chris L. Koliopoulos, Jaydeep Sinha, Delvin A. Lindley, Noel S. Poduje | 2008-01-29 |