JE

James Dean Eoff

GC Globalwafers Co.: 8 patents #36 of 221Top 20%
MM Memc Electronic Materials: 1 patents #138 of 273Top 55%
Overall (All Time): #534,764 of 4,157,543Top 15%
9
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12270768 Method of processing a cleaved semiconductor wafer Benjamin Michael Meyer, Justin Scott Kayser, John F. Valley, Vandan Tanna, William L. Luter 2025-04-08
12019031 Cleaved semiconductor wafer imaging system Benjamin Michael Meyer, Justin Scott Kayser, John F. Valley, Vandan Tanna, William L. Luter 2024-06-25
11921054 Cleaved semiconductor wafer camera system Benjamin Michael Meyer, Justin Scott Kayser, John F. Valley, Vandan Tanna, William L. Luter 2024-03-05
11866844 Methods for producing a single crystal silicon ingot using a vaporized dopant Yu-Chiao Wu, William L. Luter, Richard J. Phillips 2024-01-09
11795569 Systems for producing a single crystal silicon ingot using a vaporized dopant Yu-Chiao Wu, William L. Luter, Richard J. Phillips 2023-10-24
11499245 Additive feed systems, ingot puller apparatus and methods for forming a single crystal silicon ingot with use of such additive feed systems Marco Zardoni, Giancarlo Zago, Giorgio Agostini, Stephan Haringer 2022-11-15
10910280 Methods for separating bonded wafer structures Justin Scott Kayser, John F. Valley 2021-02-02
10679908 Cleave systems, mountable cleave monitoring systems, and methods for separating bonded wafer structures Justin Scott Kayser, John F. Valley 2020-06-09
6089285 Method and system for supplying semiconductor source material Mark A. Destefano, Thomas H. Schulte, John M. Anderson, Eng Chin Yau, Donald R. Ruggeri +2 more 2000-07-18